Difference between revisions of "Minutes-10-10-2013"

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== Tests at EEL126 ==
 
== Tests at EEL126 ==
  
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- Beni showed his results of the F1TDC tests in the following configuration: two regular cells (3 and 6) with +HV of 2150
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- Beni showed his results of the F1TDC tests (Entry 117 in the Elog) in the following configuration: two regular cells (3 and 6) with +HV of 2150V, but (due to the lack of HV cables) only half of each cell was connected to negative -500V, the other half put on 0V (ground). One can clearly see the difference in the drift time spectra (last two plots in the entry). Some of the cards/ASICs (8 chan.) are noisy, and 3 channels are missing most likely due to the cards (we have used the last spares).  Fernando suggested to try using the pulser built in the new F1TDCs, first, to test this feature, and second, to identify the source of the missing channels. The same pulser is in fADC125 but has not been tested (firmware not ready yet).
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- Eugene started discussion about the cathode deformation during the tensioning and the effects on the resolution. Beni explained that he sees some deviations from the uniformity in terms of the wire positions as reconstructed from the strips. Eugene has measured the elongation perpendicular to the strips to be 0.25% and much bigger than along the strips (GlueX doc 1090), but for 5micron copper. Based on his estimations in the same doc (Table 2) for 2 micron copper the elongation must be factor of 2 bigger but very similar in both directions, i.e. about 5mm in total. This certainly has to be taken into account in the analyses.

Revision as of 18:34, 10 October 2013

October 10, 2013 FDC meeting

Agenda

  1. Installation preparations [1] (all)
  2. Engineering (Bill)
  3. Electronics (Chris, Nick)
  4. Tests in EEL126
  5. Other


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