Difference between revisions of "Detailed plan for testing production SiPM units"
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− | Discussion notes of July 23, moved to this page for future development. | + | [[July 23, 2009 Calorimetry Discussion notes of July 23]], moved to this page for future development. |
== Testing of electronic components (Fernando) == | == Testing of electronic components (Fernando) == |
Revision as of 14:11, 26 August 2009
DRAFT DRAFT
July 23, 2009 Calorimetry Discussion notes of July 23, moved to this page for future development.
Contents
Testing of electronic components (Fernando)
- Fernando showed a tentative SiPM_Dev_Schedule, showing that testing of the electronics should be completed by mid Sep.
- Output of the preamp will be one signal per array.
Single sensor tests at room temperature (Carl)
- Check that all cells are operational by scanning across array.
- Calibrate a light source and determine a (relative) gain for each cell. Determine PDE if possible.
- Measure dark current. (Dark rate is not possible at room temperature).
Single sensor tests at 5 deg (nominal) (Carl)
- Install Peltier on each sensor gluing the Peltier to the "hot plate" and attaching the hot plate to the sensor package using a thermal paste.
- Repeat measurements performed at room temperature, but at a nominal operating temperature
- If possible measure the dark rate in this configuration.
Low irradiation
- low radiation, guestimated to be about 0.01 Gy/month)
- Place 6-8 arrays in a box with Sr source (Keep a few for reference)
- Arrays should be powered continuously
- Arrays should be operated at the nominal operating temperature (~5deg) using Peltier
- Arrays should be exposed to temperature cycles
- Output may be monitored using a picoAmmeter
Realistic exposures to radiation
- Measurements in Hall B?