Difference between revisions of "Detailed plan for testing production SiPM units"

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(Testing of electronic components (Fernando))
(Single sensor tests at 5 deg (nominal) (Carl))
 
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DRAFT DRAFT <br>
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DRAFT SiPM Testing  Plan<br>
[[July 23, 2009 Calorimetry | Discussion notes of July 23]], moved to this page for future development.
+
# [[July 23, 2009 Calorimetry | Discussion notes of July 23]], moved to this page for further refinement.
 +
# Updated based on preparations for the collaboration meeting in September.
  
 
== Testing of electronic components (Fernando) ==  
 
== Testing of electronic components (Fernando) ==  
# Fernando showed a tentative [[Media:SiPM_Dev_Schedule.pdf|SiPM_Dev_Schedule]], showing that testing of the electronics should be completed by mid October.
+
# Fernando has a schedule for developing the required on-board electronics ([[Media:SiPM_Dev_Schedule.pdf|SiPM_Dev_Schedule]]) showing that testing of the electronics could be completed by mid October.
 
# Output of the preamp will be one signal per array.
 
# Output of the preamp will be one signal per array.
  
 
== Single sensor tests at room temperature (Carl) ==
 
== Single sensor tests at room temperature (Carl) ==
# Check that all cells are operational by scanning across array.
+
# Check that all 16 cells are operational by scanning across array. Identify any problems with individual cells within the array.
# Calibrate a light source and determine a (relative) gain for each cell. Determine PDE if possible.
+
# Noise levels will be too high to measure dark rate directly -- Dark current will be measured for the array instead.
# Measure dark current. (Dark rate is not possible at room temperature).
+
# PDE can be determined relative to single-cell 3x3 mm2 units
 +
#* Measure output with calibrated light source to determine PDE for array.
 +
# When both sensors are available, measure SensL and Hamamatsu with the same illumination for comparison.
 +
 
 +
==  Stability tests of light sensors (Carl) ==
 +
# Keep several samples for reference
 +
# Arrays under test should be powered continuously.
 +
# Output may be monitored using a picoAmmeter
 +
# Measure response to high light levels (e.g. x20, x100 expected) and return to normalcy.
 +
# Radiation damage tests
 +
#* Radcon Cs-137 130 mCi calibrated radioactive source available for irradiating sensors.
 +
#* Place SiPM(s) in a small portable dark box fully powered. Use LED light pulser to monitor response as sensor is irradiated.
 +
# Temperature stability tests
 +
#* Cycle samples through temperature range and verify robustness.
 +
# Note that the expected exposure in Hall D is 0.14 Gy/year at high intensity running.
 +
 
 
==  Single sensor tests at 5 deg (nominal) (Carl) ==
 
==  Single sensor tests at 5 deg (nominal) (Carl) ==
# Install Peltier on each sensor gluing the Peltier to the "hot plate" and attaching the hot plate to the sensor package using a thermal paste.
+
# It is desirable to test SensL units at 5 deg. C.
# Repeat measurements performed at room temperature, but at a nominal operating temperature
+
# Options
 +
#* Place entire setup in an "ice-cold" box
 +
#*  Install Peltier on each sensor gluing the Peltier to the "hot plate" and attaching the hot plate to the sensor package using a thermal paste.
 +
# Repeat measurements performed at room temperature, but at the lower 5deg nominal operating temperature.
 
# If possible measure the dark rate in this configuration.
 
# If possible measure the dark rate in this configuration.
==  Low irradiation ==
 
# low radiation, guestimated to be about 0.01 Gy/month)
 
# Place 6-8 arrays in a box with Sr source (Keep a few for reference)
 
# Arrays should be powered continuously
 
# Arrays should be operated at the nominal operating temperature (~5deg) using Peltier
 
# Arrays should be exposed to temperature cycles
 
# Output may be monitored using a picoAmmeter
 
  
==   Realistic exposures to radiation ==
+
== Additional Tests ==
# Measurements in Hall B?
+
# Eugene: One test that should be included in the plan is to use two independent LED pulsers and check the linearity of response when they come close together in time.

Latest revision as of 14:37, 22 October 2009

DRAFT SiPM Testing Plan

  1. Discussion notes of July 23, moved to this page for further refinement.
  2. Updated based on preparations for the collaboration meeting in September.

Testing of electronic components (Fernando)

  1. Fernando has a schedule for developing the required on-board electronics (SiPM_Dev_Schedule) showing that testing of the electronics could be completed by mid October.
  2. Output of the preamp will be one signal per array.

Single sensor tests at room temperature (Carl)

  1. Check that all 16 cells are operational by scanning across array. Identify any problems with individual cells within the array.
  2. Noise levels will be too high to measure dark rate directly -- Dark current will be measured for the array instead.
  3. PDE can be determined relative to single-cell 3x3 mm2 units
    • Measure output with calibrated light source to determine PDE for array.
  4. When both sensors are available, measure SensL and Hamamatsu with the same illumination for comparison.

Stability tests of light sensors (Carl)

  1. Keep several samples for reference
  2. Arrays under test should be powered continuously.
  3. Output may be monitored using a picoAmmeter
  4. Measure response to high light levels (e.g. x20, x100 expected) and return to normalcy.
  5. Radiation damage tests
    • Radcon Cs-137 130 mCi calibrated radioactive source available for irradiating sensors.
    • Place SiPM(s) in a small portable dark box fully powered. Use LED light pulser to monitor response as sensor is irradiated.
  6. Temperature stability tests
    • Cycle samples through temperature range and verify robustness.
  7. Note that the expected exposure in Hall D is 0.14 Gy/year at high intensity running.

Single sensor tests at 5 deg (nominal) (Carl)

  1. It is desirable to test SensL units at 5 deg. C.
  2. Options
    • Place entire setup in an "ice-cold" box
    • Install Peltier on each sensor gluing the Peltier to the "hot plate" and attaching the hot plate to the sensor package using a thermal paste.
  3. Repeat measurements performed at room temperature, but at the lower 5deg nominal operating temperature.
  4. If possible measure the dark rate in this configuration.

Additional Tests

  1. Eugene: One test that should be included in the plan is to use two independent LED pulsers and check the linearity of response when they come close together in time.